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See all 27 Products in Family

TECHSPEC^® components are designed, specified, or manufactured by Edmund Optics. Learn More

1.75X LS Series Line Scan Lens

LS Series Line Scan Lenses

TECHSPEC® LS Series Line Scan Lenses

Stock #35-441

£3,395.75

Qty 1
£3,395.75

Volume Pricing
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eDrawings: eprt IGES PDF Drawings Specsheets STEP: step Zemax

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Primary Magnification PMAG:

1.75X

Magnification:

1.65X - 1.85X

Maximum Sensor Format:

82mm

Optimized Sensor Format:

62.5mm

Horizontal Field of View @ Max Sensor Format:

46.9mm

Numerical Aperture NA:

0.097

Aperture (f/#):

f/3.2 - f/22

Distortion (%):

<0.05

Relative Illumination:

>97%

Working Distance (mm):

65.9

Total Track (mm):

379.60

Focal Length FL (mm):

99.00

Field of View, 82mm Sensor:

46.9mm

Field of View, 62.5mm Sensor :

35.7mm

Field of View, 28.7mm Sensor:

16.4mm

Coating:

425 - 675 BBAR VIS

Mount:

V-70 Mount

Maximum Diameter (mm):

Front Diameter (mm):

Length (mm):

122.00

Mounting Diameter (mm):

Beamsplitter / Line Scan:

Yes

Type:

Line Scan

Weight (g):

1122

Note:

Beamsplitter is included. Length includes beamsplitter. Specifications are at primary magnification.

Field of View, 57.7mm Sensor :

33mm

Regulatory Compliance

RoHS:

Compliant

Product Family Description

Designed for 16k 5μm 82mm Line Scan Cameras
Also covers 12k 5μm 62.5mm and 16k 3.5μm 57.7mm Cameras
Uniform and High Resolution Over Entire Image Field

TECHSPEC® LS Series Line Scan Lenses are low distortion lenses designed for 82mm 16k line scan cameras with 5μm pixels and 62.5mm 12k line scan cameras with 5μm pixels. For coaxial inline illumination, these lenses are available with a beamsplitter for line scan sensors or with a window for area scan sensors. The locking iris is adjustable from f/2.9 to f/22, while the V-Mount provides ease of adjustment and alignment. The uniform and high resolution performance across the entire image makes the TECHSPEC® LS Series Line Scan Lenses ideal for applications such as electronics, flat panel display and semiconductor wafer inspections.