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Laser Beam Analysis

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DataRay CMOS Beam Profilers DataRay CMOS Beam Profilers New
  • Designed for Use from 355 to 1150nm
  • Compatible with Beam Diameters Down to 52µm
  • Robust and Easy to Use Free Software Provided
  • Measure Beam Wander, M², Divergence, and More
DataRay Scanning Slit Beam Profilers DataRay Scanning Slit Beam Profilers New
  • Designed For Use From 190 to 1150nm
  • Measure Beam Diameters of 2µm to 4mm
  • Robust Easy to Use Software Provided
Edmund Optics® Beam Profilers Edmund Optics® Beam Profilers
Top Seller
  • High Resolution for Accurate Small Beam Profile Measurements
  • Large Area Sensor for Large Beam Profiling
  • USB 3.0 for the Fastest Transfer Rates
#11-760 Edmund Optics TPA Ultrafast Autocorrelator by APE (700-1100nm) Edmund Optics Ultrafast Autocorrelator by APE
  • Trusted APE® Performance with Same Day Availability
  • TPA Detector with >0.1W2 Sensitivity @ 700 - 1100nm
  • Includes a Controller with USB Interface and Ready to Use Data Acquisition Software
  • Compact Design and Tuning Free Wavelength Matching
  • Ideal for Low and High Repetition Rate Ultrafast Lasers
Coherent® Lasercam™ Beam Profiler Coherent® Lasercam™ Beam Profiler
  • 12 and 14-bit Digital USB 2.0 Interface Options
  • High Sensitivity and Dynamic Range
  • Intuitive BeamView™ Software Included

Laser Beam Analysis technology is used to measure the attributes of a laser beam in order to test its usefulness or compatibility for different laser applications. Laser Beam Analysis includes devices such as profiler systems that evaluate data from beam images to provide information such as beam location, peak intensity position, stability, or beam density. Laser Beam Analysis systems offer a range of information as well as a greater amount of control over many laser applications by delivering detailed information about a tested laser.